• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The present invention relates to a measuring device for extracting a three-dimensional shape of an object to be measured using a slit beam and an image acquisition device. In particular, the entire surface shape of the object to be measured can be determined using one slit beam, one image acquisition device, and a reflection mirror. It relates to the measuring device to be extracted. When the measuring device scans the slit beam on the upper surface of the object under the slit beam generator installed in the front direction of the object under measurement, the scanned slit beam causes deformation according to the surface shape of the object under measurement. After the deformed shape of the slit beam is obtained as an image by the installed image acquisition device, the surface shape of the object to be measured is extracted by using the angle of the slit beam generator and the image acquisition device and the deformation information of the slit beam. A characteristic of the measuring device is that the slit beam is scanned when the slit beam is scanned by using a slit beam generator and a single image acquisition device to extract the shape of the object to be measured. The reflection mirror is used for shape extraction by employing a reflection mirror to extract the surface shape of the side surface of the object under test, which is an unacceptable area. In this method, after a straight slit beam is incident on the reflection mirror, the incident slit beam is reflected and scanned on the side surface of the object to be measured, and the slit beam deformed according to the surface shape on the side surface of the object is measured. Together with the reflection mirror.
    公开号:KR20000053900A
    申请号:KR1020000024231
    申请日:2000-05-06
    公开日:2000-09-05
    发明作者:임쌍근；이상윤；김승우；오정택；정창진
    申请人:임쌍근；주식회사 인텍엔지니어링；
    IPC主号:
    专利说明:

    Arbitrary surface shape measuring device using reflection mirror and slit beam
    The present invention relates to a measuring device for extracting a three-dimensional shape of an object to be measured using a slit beam and an image acquisition device. In particular, the entire surface shape of the object to be measured can be determined using one slit beam, one image acquisition device, and a reflection mirror. It relates to the measuring device to be extracted.
    When the measuring device scans the slit beam on the upper surface of the object under the slit beam generator installed in the front direction of the object under measurement, the scanned slit beam causes deformation according to the surface shape of the object under measurement. After the deformed shape of the slit beam is obtained as an image by the installed image acquisition device, the surface shape of the object to be measured is extracted by using the angle of the slit beam generator and the image acquisition device and the deformation information of the slit beam. A characteristic of the measuring device is that the slit beam is scanned when the slit beam is scanned by using a slit beam generator and a single image acquisition device to extract the shape of the object to be measured. The reflection mirror is used for shape extraction by employing a reflection mirror to extract the surface shape of the side surface of the object under test, which is an unacceptable area. In this method, after a straight slit beam is incident on the reflection mirror, the incident slit beam is reflected and scanned on the side of the object to be measured, and the slit beam deformed according to the surface shape of the side of the object is measured. Together with the reflection mirror. The image of the object to be measured and the deformed slit beam generated in the reflection mirror is obtained as an image by an image acquisition device provided in front of the object to be measured. Therefore, the slit beam is scanned on the front and side surfaces of the object under measurement using one slit beam generator and the reflection mirror, and the slit beam is deformed on the front and side surfaces of the object under measurement using one image acquisition device and the reflection mirror. By acquiring an image, the present invention relates to a measuring device for extracting a surface shape of an object to be measured. The measuring device can be applied to a measurement object that requires a plurality of slit beam generators and a plurality of image acquisition devices to extract the surface shape of an arbitrary three-dimensional object, which measures one slit beam generator and one image acquisition device. After being installed toward the water, the reflection mirror can be appropriately installed in an area where the slit beam generator and the image acquisition device cannot reach, thereby being applicable to various types of objects to be measured. In addition, one or more reflection mirror installation positions may be used depending on the type of measurement object and the measurement purpose, and the reflection mirror may be used in various forms on the flat surface, the curved surface, and the upper surface. In the present invention, a person's foot is applied to the object to be measured, and the shape of the reflection mirror is flat, and the number of uses is limited to two, and the measurement device is applied to the measuring device.
    The present invention targets a person's foot (hereinafter referred to as "customer's foot") as the object to be measured and measures the shape of the person's foot by applying the above-mentioned measuring device. The measurement results can be used to extract a representative value of the surface shape of the foot, which is used in the production of shoe swatches (Shoelast) used to produce the best shoes to fit the surface shape of the foot.
    The method of measuring the surface shape of the customer's foot is a product that obtains only a few values of making shoe swatches such as foot length, width, and height using five CCD cameras, but the measuring device does not acquire heel information. It takes about ten seconds to make a measurement, and because CCD cameras must be installed all around the customer's feet, the equipment is bulky, expensive, and the measurement repeat error is large, making accurate shoelaces. There is difficulty. Another device is provided with a light emitting unit for projecting infrared light in a straight line up and down on one side of the foot to be measured, and a light receiving unit for detecting the infrared light emitted from the light emitting unit is located on the opposite side. When the customer's foot is positioned between the light emitting part and the light receiving part, infrared light is projected from the light emitting part, and infrared light is transmitted to the light receiving part according to the surface shape of the foot which the infrared light cannot transmit, thereby extracting the surface shape of the foot from the information. In the method using the infrared ray, the cross section of the foot to be measured can be obtained with a relatively accurate result. However, since only the result of the cross section of the two-dimensional shape of the foot can be obtained as described above, an accurate foot surface shape cannot be obtained.
    Another device consists of three modules consisting of a slit beam generator and a CCD camera. Each module scans the slit beams on the front and left and right sides of the foot, respectively, and acquires the deformation form of the slit beam with each CCD camera. The surface shape of the foot is extracted from the geometric configuration considering the installation position of the slit beam and CCD camera and the position of the customer's foot. In order to extract the shape of the foot by synthesizing the results extracted from each module into one, such as the measuring device, the structure of the measuring instrument is very complicated because the installation correlation between each module must be known correctly and the elements of each module must be managed to be correctly positioned. The equipment is expensive because three slit beam generators and three CCD cameras are required.
    The present invention proposes a device capable of measuring the surface shape of a foot using one slit beam generator, one image acquisition device, and a reflection mirror. To this end, the present invention employs a reflecting mirror so that the slit beam is scanned on the side surface of the foot, which is a rectangular area where the slit beam does not reach when the slit beam is scanned from the front of the foot, and primarily reflects the slit beam incident on the reflecting mirror. When the slit beam scanned on the side of the foot is deformed according to the shape of the side of the foot, the slit beam is deformed, and the deformed slit beam is reflected on the reflecting mirror to be imaged to the image acquisition device in front. By obtaining the surface shape information is obtained. That is, a slit beam is scanned on the front and side of the foot by using a slit beam generator and a reflection mirror, and an image of the modified slit beam on the front and side of the foot is obtained by using an image acquisition device and the reflection mirror. The present invention proposes a measuring device for extracting the shape of a foot.
    First, prior to applying the measuring device to the foot of the customer, the slit beam analysis using the slit beam of Figure 3 for the understanding of the slit beam measuring method applied in the present invention will be introduced.
    * Measurement principle of slit beam
    1. For convenience of explanation, assume that the optical axis of the camera is installed to coincide with the Z axis, and the slit beam is incident in parallel with the X axis.
    2. A point on the slit beam image acquired using the image acquisition device Is a point on the surface of the actual measuring object (foot) Has a one-to-one correspondence with Therefore, using the optical triangulation method, the coordinates of the obtained slit beam image Coordinates of the measuring object (foot) surface from You can get the method, as follows.
    3. Points on the surface of the measuring object (foot) when applying the pinhole camera model Is a point on the slit beam image And the line L connecting the center point Pc of the lens and the plane A formed by the slit beam incident on the measurement object meet each other.
    4. Line L
    (One)
    Which is represented by Is the distance on the optical axis from the coordinate origin to the lens center point, Direction vector of line L The distance from the lens center point to the imaging surface of the image acquisition device as the y and z components of Is obtained as follows.
    (2)
    5. Flat A
    (3)
    Which is represented by Is the y-coordinate of the intersection generated when the slit beam incident on the measuring object (foot) meets the reference plane with z = 0, Is the normal vector of plane A Incident angle of the slit beam as the y, z component of Is obtained as follows.
    (4)
    6. If you combine equations (1) and (2), The y and z coordinates of are given by
    (5)
    (6)
    7. Finally point The x coordinate value of is obtained from the geometric optical relation as follows.
    (7)
    In the general case where the camera's optical axis is inclined at a certain angle with respect to Z, the equation becomes more complicated, but similarly, the intersection of the plane formed by the line passing through the center of the lens from the point on the slit beam image and the slit beam incident on the measuring object is formed. If so, the coordinates of the point on the measurement object corresponding to one point on the slit beam image can be obtained.
    1- shows a schematic diagram of the present invention
    2-A diagram showing the correlation between the measurement object, the reflection mirror and the slit beam
    FIG. 3-Slit Beam Analysis Using Slit Beam
    Figure 4-By using the slit beam and the reflection mirror can measure any three-dimensional shape
    Drawing showing measuring equipment
    The configuration of the present invention comprises a slit beam generator, a control unit for extracting a surface shape with an image acquisition device, a pair of reflection mirrors and a modified slit beam obtained from the image acquisition device. 1 shows a schematic configuration diagram of the present invention. Referring to the configuration shown in Figure 1, the measuring object (1) representing the shape of the customer's foot and the reflection mirror (4) (5) is provided on both sides of the measuring object, the slit beam for generating a slit beam at a certain position in front of the measuring object A generator 3 and an image acquisition device 2 are provided. In the method for measuring the surface shape of the workpiece, when the slit beam parallel to the X axis is irradiated in the slit beam generator, the slit beam irradiated in a straight line is incident to the slit beam in a deformed form according to the surface shape of the workpiece and the The slit beam shows a modified slit beam including surface shape information. The image of the deformed slit beam is acquired by the image acquisition apparatus 2, and the surface shape information is extracted by analyzing the slit beam analysis method described above. However, when the slit beam is incident from the front of the workpiece as described above, the slit beam reaches and the front side can obtain a modified slit beam having the surface shape information, so that the surface shape can be measured. Surface shape extraction is impossible because it is not blocked in front of the workpiece. The conventional measuring method for overcoming this is to install separate image acquisition devices and slit beam generators on both sides, as mentioned above, to generate slit beams from them and obtain the modified slit beams to extract surface shape information. do. The main feature of the present invention is that in order to overcome the problem of using a plurality of slit beam generators and image acquisition devices as described above, as shown in Figure 1, the reflection mirror (4) (5) Surface shape measurement equipment that can measure the whole object with one image acquisition device and one slit beam generator by using the image obtained by the image acquisition device to extract the image of the surface shape. It is about. 2 shows the correlation between the measurement object, the reflection mirror, and the slit beam. The figure shown below will be described. Reflecting mirrors 4 and 5 are provided on both sides of the measurement object 1. The reflection mirror appears on the left side (1 ') and the right side (1 ") of the workpiece. When the slit beam is incident on the slit beam generator, some of the slit beams are incident on the mirror (10a) (10f) The slit beams are shown in a straight line form 10b and 10d in their original form, and some of the slit beams are shown as a deformed form 10c which is incident on the front side of the workpiece and has surface shape information. 10f) actually shows that one linear slit beam is changed to a different shape according to the state of each surface shape, and (10a) and 10f, which are incident on the reflective mirror of the slit beam, are reflected again and the measured object ( The incident slit beam is incident on the side of 1) and appears as modified shapes 11a and 11b including the surface shape information according to the surface shape, and the modified slit beam is imaged on the reflection mirror. Slit beams (11a ') (11b') is a reflection mirror C. As described above, the front part of the workpiece is directly illuminated by using the deformed slit beam shape 10c, and the part which is hard to reach by using the deformed slit beam image 11a 'and 11b' that appears in the reflection mirror. By extracting the surface shape information, it can be seen that a complex surface shape can be measured using one slit beam generator and one image acquisition device. In order to analyze the deformed slit beam 10c by directly irradiating the slit beam, the above-described general slit beam analysis method may be applied, but the analysis of the deformed slit beam 11a 'and 11b' reflected in the reflection mirror In the present invention, the detailed description will be omitted, and only the conclusion will be described. Only the left side 1 'and the right side 1' 'of the workpiece reflected in the reflection mirror are actually positioned at the position. The deformed slit beams 11a 'and 11b' are considered to be deformed slit beams according to the shape of the rear surface in which the slit beams generated by the actual slit beam generator are directly incident on the measured object considered to be real. This can be interpreted. Therefore, in summary, one slit beam is incident on the front part of the actual workpiece 1 and on the workpiece (1 ') (1 ") formed on the reflection mirror, and the front and side parts of the workpiece By analyzing the slit beams 10c, 11a ', and 11b', each of which is modified according to the surface shape of, the front and side surfaces of the workpiece can be measured simultaneously. When applying the above-mentioned general slit beam analysis and analyzing the slit beam of the workpiece (1 ') (1 "), the phase (1') (1") of the workpiece is regarded as the actual workpiece and The general slit beam analysis method is applied, but the position of the image (1 ') (1 ") can be obtained by using the reflection law of the mirror. Although the above description has been made to analyze when one slit beam is irradiated, in order to measure a workpiece having a three-dimensional surface shape, the slit beam is moved at regular intervals along the y axis of FIG. It is possible by investigating and interpreting. At this time, the slit beam scanning device that moves the slit beam at a certain interval on the y axis has a variety of methods such as changing the angle of irradiation of the slit beam by using a mirror, using a polygon mirror, and using a motor and a linear transfer mechanism. The above description is well known to those skilled in the art, and detailed description thereof will be omitted.
    Figure 4 shows a measuring device that can measure any three-dimensional shape using the slit beam and the reflection mirror described above.
    More specifically about the slit beam generator, a laser beam from a laser diode is converted into a slit beam while passing through a cylindrical lens, which is reflected by a plane mirror which can be rotated by a motor, and converts the angle of the planar mirror. The slit beam is irradiated over a certain distance by the slit beam at a predetermined distance so that the entire slit beam is continuously irradiated to the measurement area. The slit beam is irradiated directly to the front of the workpiece, and the side of the workpiece is irradiated through the reflection mirror. The irradiated slit beams are deformed according to the surface shape of the workpiece, and the deformed slit beams are formed on the image pickup surface of the image acquisition device through the optical device. The image acquisition board transfers the formed slit beam image to the PC, and the PC extracts the three-dimensional shape of the workpiece through the optical triangulation method.
    In the measurement of the surface shape of various shaped workpieces with slit beams, several slit beam generators and image acquisition devices have been conventionally required, but in the present invention, one slit beam generator and one image acquisition system are provided by introducing a reflection mirror. By using the device, it is possible to construct a measuring instrument that can measure the surface shape of various shaped workpieces, and by applying the equipment to a human foot to measure the surface shape of the foot, the optimum shoe suitable for the measured person's foot Can extract data to produce.
    权利要求:
    Claims (4)
    [1" claim-type="Currently amended] In equipment for measuring the surface shape of an arbitrary three-dimensional workpiece using a slit beam, the configuration of the equipment is composed of one slit beam generator, one image acquisition means, and a reflection mirror, and the slit beam is applied to the workpiece. By directly irradiating and analyzing the slit beam deformed according to the surface shape by means of an image acquisition means, the surface shape is measured, but the portion where the slit beam is not directly irradiated reflects a portion of the slit beam by using the reflection mirror. By irradiating the measurement object and analyzing the slit beam deformed according to the surface shape by the image acquisition means through the reflection mirror, the surface shape of the entire object of arbitrary shape is analyzed by one slit beam generator and one image acquisition means. And a measuring instrument configured to simultaneously measure the portion where the slit beam is directly irradiated and the portion that is irradiated through the reflecting mirror using a reflection mirror .
    [2" claim-type="Currently amended] The method of claim 1, wherein the slit beam generated by the slit beam generator is irradiated while moving at a predetermined interval by the slit beam scanning means, so that the slit beam can be irradiated to all parts of the measurement object so that the surface shape of the whole measurement object is one. Measurement equipment consisting of a slit beam generator and a structure that can measure the portion of the slit beam directly irradiated and the portion irradiated through the reflection mirror using a single image acquisition means and a reflection mirror.
    [3" claim-type="Currently amended] In the equipment for measuring the surface shape of a human foot, the equipment is composed of one slit beam generator, slit beam scanning means, one image acquisition means, and a pair of reflection mirrors, and the slit beam generator and image acquisition The means is installed at a certain position in front of the measurement object, the reflection mirror is located on both sides of the foot, and when the slit beam is scanned from the slit beam generator, the instep portion to which the slit beam is directly irradiated has a surface shape from the deformation form of the slit beam. The foot side portion to which the slit beam is not directly irradiated measures the surface shape from the deformation of the slit beam irradiated on the foot side portion formed on the reflective mirror, and the slit beam generated by the slit beam generator is the slit beam. Irradiated while moving at regular intervals by the scanning means, the foot of the foot using one slit beam generator, one image acquisition means and a reflection mirror Parts, measuring equipment consisting of a structure capable of measuring the surface shape of the foot side parts at the same time.
    [4" claim-type="Currently amended] The method of claim 3, wherein a portion of the slit beam irradiated by the slit beam generator is used to measure the surface shape of the instep by directly irradiating the instep to form a modified slit beam, and the other part of the slit beam is incident on the reflection mirror The slit beam is incident on the side of the foot, and the slit beam incident on the side of the foot forms a deformed slit beam according to the surface shape of the foot, and the deformed slit beam is formed on the reflective mirror together with the side. By measuring the surface shape of the instep of the foot and the side portion of the foot using a single slit beam generator, a single image acquisition means and a reflection mirror.
    类似技术:
    公开号 | 公开日 | 专利标题
    US20170280132A1|2017-09-28|System and method of acquiring three-dimensional coordinates using multiple coordinate measurment devices
    US9501833B2|2016-11-22|Method and system for providing three-dimensional and range inter-planar estimation
    CN105143820B|2017-06-09|Depth scan is carried out using multiple transmitters
    US10514148B2|2019-12-24|Pattern projection using microlenses
    US10690494B2|2020-06-23|Dual-resolution 3D scanner and method of using
    CN104634276B|2018-08-07|Three-dimension measuring system, capture apparatus and method, depth computing method and equipment
    US8374397B2|2013-02-12|Depth-varying light fields for three dimensional sensing
    US20130279753A1|2013-10-24|Distance-Varying Illumination and Imaging Techniques for Depth Mapping
    Dana2001|BRDF/BTF measurement device
    Schaffer et al.2010|High-speed pattern projection for three-dimensional shape measurement using laser speckles
    Sanderson et al.1988|Structured highlight inspection of specular surfaces
    US8121352B2|2012-02-21|Fast three dimensional recovery method and apparatus
    JP5337243B2|2013-11-06|Adaptive 3D scanning system for surface features
    US5621529A|1997-04-15|Apparatus and method for projecting laser pattern with reduced speckle noise
    DE60202198T2|2005-12-08|Device and method for generating three-dimensional position data from a collected two-dimensional image
    ES2313036T3|2009-03-01|Procedure and system for the reconstruction of the three-dimensional surface of an object.
    KR100406843B1|2003-11-21|Real time 3D surface shape measurement method and device using color information
    US5646733A|1997-07-08|Scanning phase measuring method and system for an object at a vision station
    US7800643B2|2010-09-21|Image obtaining apparatus
    ES2247853T3|2006-03-01|Method and device for the optical inspection of objects situated on a substrate.
    US7903261B2|2011-03-08|Controlling a projected pattern
    EP0788593B1|1999-07-28|Height and profile of an object
    EP1462992B1|2008-09-03|System and method for shape reconstruction from optical images
    TW571072B|2004-01-11|System for simultaneous projections of multiple phase-shifted patterns for the three-dimensional inspection of an object
    AU2004273957B2|2009-05-28|High speed multiple line three-dimensional digitization
    同族专利:
    公开号 | 公开日
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    法律状态:
    2000-05-06|Application filed by 임쌍근, 주식회사 인텍엔지니어링
    2000-05-06|Priority to KR1020000024231A
    2000-05-06|Priority claimed from KR1020000024231A
    2000-09-05|Publication of KR20000053900A
    2002-07-24|Application granted
    2002-07-24|Publication of KR100344244B1
    优先权:
    申请号 | 申请日 | 专利标题
    KR1020000024231A|KR100344244B1|2000-05-06|Arbitrary surface shape measuring device using reflection mirror and slit beam|
    [返回顶部]